Datasheet RH137 (Analog Devices) - 3

RH137
TABLE 1A. ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 4) 10KRAD(Si) 20KRAD(Si) 50KRAD(Si) 100KRAD(Si) 200KRAD(Si) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
IADJ Adjust Pin 100 100 100 100 100 µA Current ∆IADJ Adjust Pin 10mA ≤ IOUT ≤ IMAX 5 5 5 5 5 µA Current 3V ≤ |VIN – VOUT| ≤ 30V 5 5 5 5 5 µA Change IMIN Minimum |VIN – VOUT| = 30V 5 5 5 5 5 mA Load Current |VIN – VOUT| ≤ 10V 3 3 3 3 3 mA Current Limit H Package |VIN – VOUT| ≤ 15V 0.5 0.5 0.5 0.5 0.5 A |VIN – VOUT| = 30V 0.15 0.15 0.15 0.15 0.15 A K Package |VIN – VOUT| ≤ 15V 1.5 1.5 1.5 1.5 1.5 A |VIN – VOUT| = 30V 0.24 0.24 0.24 0.24 0.24 A
Note 1:
Unless otherwise specified, these specifications apply for
Note 3:
Guaranteed by design, characterization or correlation to other |VIN – VOUT| = 5V; and IOUT = 0.1A for the H Package (TO-39) and tested parameters. IOUT = 0.5A for the K Package (TO-3). Although power dissipation is
Note 4:
TJ = 25°C unless otherwise noted. internally limited, these specifications are applicable for power dissipations
Note 5:
ISC is tested at the ambient temperatures of 25°C and –55°C. of 2W for the TO-39 and 20W for the TO-3. IMAX is 0.2A for the TO-39 and ISC cannot be tested at the maximum ambient temperature of 150°C due 1.5A for the TO-3 package. to the high power level required. ISC specification at 150°C ambient is
Note 2:
Regulation is measured at a constant junction temperature using guaranteed by characterization and correlation to 25°C testing. pulse testing with a low duty cycle. Changes in output voltage due to heating effects are covered under the specification for thermal regulation.
TABLE 2. ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*, 2, 3 The PDA is specified as 5% based on failures from group A, subgroup 1, Group A Test Requirements (Method 5005) 1, 2, 3 tests after cooldown as the final electrical test in accordance with method 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D End Point Electrical Parameters 1, 2, 3 (Method 5005) burn-in divided by the total number of devices submitted for burn-in in that lot shall be used to determine the percent for the lot. * PDA Applies to subgroup 1. See PDA Test Notes. Analog Devices reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
+15V 2k 243Ω RH137 1 2 ADJ OUTPUT VIN CASE –15V RH137 TDBC Rev. D Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications For more information www.a subject to change without notice. No license is granted by implication or other nalog.com wise under any patent or patent rights of Analog Devices. 3 Document Outline Description Burn-In Circuit Absolute Maximum Ratings Package/Order Information Table 1. Electrical Characteristics Table 1A. Electrical Characteristics Table 2. Electrical Test Requirements Total Dose Bias Circuit Typical Application Typical Performance Characteristics