Datasheet ADXL356-EP (Analog Devices) - 4
| Manufacturer | Analog Devices |
| Description | Low Noise, Low Drift, Low Power, 3-Axis MEMS Accelerometer |
| Pages / Page | 9 / 4 — ADXL356-EP. Enhanced Product. Parameter. Test Conditions/Comments. Min. … |
| File Format / Size | PDF / 345 Kb |
| Document Language | English |
ADXL356-EP. Enhanced Product. Parameter. Test Conditions/Comments. Min. Typ. Max. Unit
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ADXL356-EP Enhanced Product Parameter Test Conditions/Comments Min Typ Max Unit
TEMPERATURE SENSOR Output at 25°C 963.3 mV Scale Factor 3.0 mV/°C TEMPERATURE Operating Temperature Range −55 +125 °C 1 The resonant frequency is a sensor characteristic. An integrated analog 1.5 kHz (−6 dB) sinc low-pass filter that cannot be bypassed limits the actual output response. 2 The temperature change is −55°C to +25°C or +25°C to +125°C. 3 The VRE measurement is the shift in dc offset while the device is subject to 12.5 g rms of random vibration from 50 Hz to 2 kHz. The device under test (DUT) is configured for the ±10 g range and an output data rate of 4 kHz. The VRE scales with the range setting. 4 When V1P8ANA and V1P8DIG are generated internally, VSUPPLY is valid. To disable the LDO and drive V1P8ANA and V1P8DIG externally, connect VSUPPLY to VSS. 5 Standby to measurement mode; valid when the output is within 5 mg of the final value. Rev. 0 | Page 4 of 9 Document Outline FEATURES ENHANCED PRODUCT FEATURES APPLICATIONS FUNCTIONAL BLOCK DIAGRAM GENERAL DESCRIPTION TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS OUTLINE DIMENSIONS ORDERING GUIDE
TEMPERATURE SENSOR Output at 25°C 963.3 mV Scale Factor 3.0 mV/°C TEMPERATURE Operating Temperature Range −55 +125 °C 1 The resonant frequency is a sensor characteristic. An integrated analog 1.5 kHz (−6 dB) sinc low-pass filter that cannot be bypassed limits the actual output response. 2 The temperature change is −55°C to +25°C or +25°C to +125°C. 3 The VRE measurement is the shift in dc offset while the device is subject to 12.5 g rms of random vibration from 50 Hz to 2 kHz. The device under test (DUT) is configured for the ±10 g range and an output data rate of 4 kHz. The VRE scales with the range setting. 4 When V1P8ANA and V1P8DIG are generated internally, VSUPPLY is valid. To disable the LDO and drive V1P8ANA and V1P8DIG externally, connect VSUPPLY to VSS. 5 Standby to measurement mode; valid when the output is within 5 mg of the final value. Rev. 0 | Page 4 of 9 Document Outline FEATURES ENHANCED PRODUCT FEATURES APPLICATIONS FUNCTIONAL BLOCK DIAGRAM GENERAL DESCRIPTION TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS OUTLINE DIMENSIONS ORDERING GUIDE
